MicroFinish Topographer
Universal Surface Roughness Measurement


FLEXIBILITY IN MEASUREMENT
The small size and light weight of the MFT make it possible to measure substrates and configurations not possible with other instruments. The MFT has been used to make direct measurements of large substrates used in Cherenkov reflectors with delicate dielectric coatings and cylindrical X-ray mirrors where the MFT sat inside the barrel shaped mirror that was only 3 mm thick.
Further the MFT is small and light enough to mount directly on a diamond turning machine for in-situ measurement of roughness and figure.
IMMEDIATE FINISH FEEDBACK
Recently the MFT was used for this purpose on two large telescope mirror projects.
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